{"product_id":"active-probe-atomic-force-microscopy-a-practical-guide-on-precision-instrumentation-9783031442353","title":"Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation","description":"\u003cp\u003e • Author(s): Fangzhou Xia | Ivo W. Rangelow | Kamal Youcef-Toumi\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Measurement\u003c\/p\u003e\u003cp\u003eFrom a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM).\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Paperback","offer_id":47658043310231,"sku":"9783031442353","price":4774.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9783031442353.webp?v=1775816589","url":"https:\/\/atlanticbooks.com\/products\/active-probe-atomic-force-microscopy-a-practical-guide-on-precision-instrumentation-9783031442353","provider":"Atlantic Books","version":"1.0","type":"link"}