{"product_id":"advanced-laser-diode-reliability-9781785481543","title":"Advanced Laser Diode Reliability","description":"\u003cp\u003e • Author(s): Massimo Vanzi\u003cbr\u003e • Publisher: Iste Press - Elsevier\u003cbr\u003e • Publisher Imprint: Iste Press - Elsevier\u003cbr\u003e • BISAC: Electronics - Solid State\u003c\/p\u003e\u003cp\u003e\u003ci\u003eAdvanced Laser Diode Reliability \u003c\/i\u003efocuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.\u003c\/p\u003e","brand":"Iste Press - Elsevier","offers":[{"title":"Hardcover","offer_id":45310039228567,"sku":"9781785481543","price":7035.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9781785481543.webp?v=1769286931","url":"https:\/\/atlanticbooks.com\/products\/advanced-laser-diode-reliability-9781785481543","provider":"Atlantic Books","version":"1.0","type":"link"}