{"product_id":"advances-in-optics-of-charged-particle-analyzers-part-2-9780443317200","title":"Advances in Optics of Charged Particle Analyzers: Part 2","description":"\u003cp\u003e • Author(s): Peter W. Hawkes | Martin H\u003cbr\u003e • Publisher: Academic Press\u003cbr\u003e • Publisher Imprint: Academic Press\u003cbr\u003e • BISAC: Signals \u0026amp; Signal Processing\u003c\/p\u003e\u003cp\u003e\u003ci\u003eAdvances in Optics of Charged Particle Analyzers: Part Two, Volume 233\u003c\/i\u003e merges two long-running serials, \u003ci\u003eAdvances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy\u003c\/i\u003e. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.\u003c\/p\u003e","brand":"Academic Press","offers":[{"title":"Hardcover","offer_id":46941490053271,"sku":"9780443317200","price":14201.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780443317200.webp?v=1772020058","url":"https:\/\/atlanticbooks.com\/products\/advances-in-optics-of-charged-particle-analyzers-part-2-9780443317200","provider":"Atlantic Books","version":"1.0","type":"link"}