{"product_id":"advances-in-scanning-probe-microscopy-9783540667186","title":"Advances in Scanning Probe Microscopy","description":"\u003cp\u003e • Author(s): T. Sakurai\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Physics - Condensed Matter\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003cb\u003eFrom the Back Cover\u003c\/b\u003e\u003cbr\u003eThis book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Hardcover","offer_id":45278487216279,"sku":"9783540667186","price":7345.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9783540667186.webp?v=1769291090","url":"https:\/\/atlanticbooks.com\/products\/advances-in-scanning-probe-microscopy-9783540667186","provider":"Atlantic Books","version":"1.0","type":"link"}