{"product_id":"an-introduction-to-logic-circuit-testing-9783031797842","title":"An Introduction to Logic Circuit Testing","description":"\u003cp\u003e • Author(s): Parag K. Lala\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Logic Design\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eAn Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits\/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction \/ Fault Detection in Logic Circuits \/ Design for Testability \/ Built-in Self-Test \/ References\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Paperback","offer_id":45280458866839,"sku":"9783031797842","price":2038.0,"currency_code":"INR","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9783031797842.webp?v=1769296377","url":"https:\/\/atlanticbooks.com\/products\/an-introduction-to-logic-circuit-testing-9783031797842","provider":"Atlantic Books","version":"1.0","type":"link"}