{"product_id":"anwendungen-der-hochauflosenden-sekundarionenmassenspektrometrie-sims-in-der-oberflachenanalyse-9783531030494","title":"Anwendungen der hochauflösenden Sekundärionenmassenspektrometrie (SIMS) in der Oberflächenanalyse","description":"\u003cp\u003e • Author(s): Günther~ Vonœ Bünau\u003cbr\u003e • Publisher: Vs Verlag Fur Sozialwissenschaften\u003cbr\u003e • Publisher Imprint: Vs Verlag Fur Sozialwissenschaften\u003cbr\u003e • BISAC: General\u003c\/p\u003e","brand":"Vs Verlag Fur Sozialwissenschaften","offers":[{"title":"Paperback","offer_id":47615376097431,"sku":"9783531030494","price":7092.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9783531030494.webp?v=1775100371","url":"https:\/\/atlanticbooks.com\/products\/anwendungen-der-hochauflosenden-sekundarionenmassenspektrometrie-sims-in-der-oberflachenanalyse-9783531030494","provider":"Atlantic Books","version":"1.0","type":"link"}