{"product_id":"atomic-force-microscopy-a-concise-introduction-9789819823093","title":"Atomic Force Microscopy: A Concise Introduction","description":"\u003cp\u003e • Author(s): Burnham Nancy a\u003cbr\u003e • Publisher: World Scientific Publishing Company\u003cbr\u003e • Publisher Imprint: World Scientific Publishing Company\u003cbr\u003e • BISAC: Materials Science - Thin Films, Surfaces \u0026amp; Interfaces\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eThis book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eDesigned for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.\u003c\/p\u003e\u003cul\u003e\n\u003cli\u003ePart I - AFM Instrumentation: Explains the working principles, components, and imaging modes of atomic force microscopy, enabling readers to confidently obtain high-quality topographic images from any AFM system.\u003c\/li\u003e\n\u003cli\u003ePart II - Force-Curve Acquisition and Interpretation: Guides readers through force spectroscopy, demonstrating how force-distance curves are acquired and interpreted while connecting the results to underlying physical and materials science principles.\u003c\/li\u003e\n\u003cli\u003eAdvanced Chapter - Dynamic AFM Techniques: Introduces dynamic and resonance-based AFM, using complex numbers and differential equations to explain advanced imaging and measurement methods.\u003c\/li\u003e\n\u003c\/ul\u003e\u003cp\u003e\u003c\/p\u003e","brand":"World Scientific Publishing Company","offers":[{"title":"Hardcover","offer_id":47593255698583,"sku":"9789819823093","price":9050.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9789819823093.webp?v=1774981191","url":"https:\/\/atlanticbooks.com\/products\/atomic-force-microscopy-a-concise-introduction-9789819823093","provider":"Atlantic Books","version":"1.0","type":"link"}