{"product_id":"built-in-self-test-and-digital-self-calibration-for-rf-socs-9781441995476","title":"Built-In-Self-Test and Digital Self-Calibration for RF Socs","description":"\u003cp\u003e • Author(s): Sleiman Bou-Sleiman | Mohammed Ismail\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Electronics - Circuits - General\u003c\/p\u003e\u003cp\u003eThis book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Paperback","offer_id":47578583957655,"sku":"9781441995476","price":5613.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9781441995476.webp?v=1774906482","url":"https:\/\/atlanticbooks.com\/products\/built-in-self-test-and-digital-self-calibration-for-rf-socs-9781441995476","provider":"Atlantic Books","version":"1.0","type":"link"}