{"product_id":"coherent-electron-microscopy-designing-faster-and-brighter-electron-sources-9780443193248","title":"Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources","description":"\u003cp\u003e • Author(s): Peter W. Hawkes\u003cbr\u003e • Publisher: Academic Press\u003cbr\u003e • Publisher Imprint: Academic Press\u003cbr\u003e • BISAC: Signals \u0026amp; Signal Processing\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003ci\u003eCoherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227\u003c\/i\u003e in the \u003ci\u003eAdvances in Imaging and Electron Physics\u003c\/i\u003e series, merges two long-running serials, \u003ci\u003eAdvances in Electronics and Electron Physics\u003c\/i\u003e and \u003ci\u003eAdvances in Optical and Electron Microscopy\u003c\/i\u003e. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more.\u003c\/p\u003e \u003cp\u003eThe series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.\u003c\/p\u003e","brand":"Academic Press","offers":[{"title":"Hardcover","offer_id":45310411473047,"sku":"9780443193248","price":13789.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780443193248.webp?v=1769287835","url":"https:\/\/atlanticbooks.com\/products\/coherent-electron-microscopy-designing-faster-and-brighter-electron-sources-9780443193248","provider":"Atlantic Books","version":"1.0","type":"link"}