{"product_id":"data-driven-fault-detection-for-industrial-processes-canonical-correlation-analysis-and-projection-based-methods-9783658167554","title":"Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods","description":"\u003cp\u003e • Author(s): Zhiwen Chen\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer Vieweg\u003cbr\u003e • BISAC: Automation\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003cb\u003eFrom the Back Cover\u003c\/b\u003e\u003cbr\u003eZhiwen Chen aims to develop advanced fault detection (FD) methods for the monitoring of industrial processes. With the ever increasing demands on reliability and safety in industrial processes, fault detection has become an important issue. Although the model-based fault detection theory has been well studied in the past decades, its applications are limited to large-scale industrial processes because it is difficult to build accurate models. Furthermore, motivated by the limitations of existing data-driven FD methods, novel canonical correlation analysis (CCA) and projection-based methods are proposed from the perspectives of process input and output data, less engineering effort and wide application scope. For performance evaluation of FD methods, a new index is also developed.\u003cbr\u003e\u003cb\u003eContents\u003c\/b\u003e\u003c\/p\u003e\u003cul\u003e\n\u003cli\u003eA New Index for Performance Evaluation of FD Methods\u003cbr\u003e\n\u003c\/li\u003e\n\u003cli\u003eCCA-based FD Method for the Monitoring of Stationary Processes\u003cbr\u003e\n\u003c\/li\u003e\n\u003cli\u003eProjection-based FD Method for the Monitoring of Dynamic Processes \u003cbr\u003e\n\u003c\/li\u003e\n\u003cli\u003eBenchmark Study and Real-Time Implementation\u003cbr\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\u003cb\u003eTarget Groups\u003c\/b\u003e\u003cul\u003e\n\u003cli\u003eResearchers and students in the field of process control and statistical hypothesis testing\u003cbr\u003e\n\u003c\/li\u003e\n\u003cli\u003eResearch and development engineers in the process industry\u003cbr\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\u003cb\u003eAbout the Author\u003c\/b\u003e\u003cb\u003eZhiwen Chen's\u003c\/b\u003e research interests include multivariate statistical process monitoring, model-based and data-driven fault diagnosis as well as their application to industrial processes. He is currently working at the School of Information Science and Engineering at Central South University, China.\u003cbr\u003e","brand":"Springer","offers":[{"title":"Paperback","offer_id":45280229556375,"sku":"9783658167554","price":5450.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9783658167554.webp?v=1769295720","url":"https:\/\/atlanticbooks.com\/products\/data-driven-fault-detection-for-industrial-processes-canonical-correlation-analysis-and-projection-based-methods-9783658167554","provider":"Atlantic Books","version":"1.0","type":"link"}