{"product_id":"digital-hardware-testing-transistor-level-fault-modeling-and-testing-9780890065808","title":"Digital Hardware Testing: Transistor-Level Fault Modeling and Testing","description":"\u003cp\u003e • Author(s): Rochit Rajsuman\u003cbr\u003e • Publisher: Artech House Publishers\u003cbr\u003e • Publisher Imprint: Artech House Publishers\u003cbr\u003e • BISAC: Electronics - Circuits - Integrated\u003c\/p\u003e\u003cp\u003eDigital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path.\u003c\/p\u003e","brand":"Artech House Publishers","offers":[{"title":"Hardcover","offer_id":47781169463447,"sku":"9780890065808","price":13723.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780890065808.webp?v=1778051029","url":"https:\/\/atlanticbooks.com\/products\/digital-hardware-testing-transistor-level-fault-modeling-and-testing-9780890065808","provider":"Atlantic Books","version":"1.0","type":"link"}