{"product_id":"digital-integrated-circuit-testing-from-a-quality-perspective-9780442006433","title":"Digital Integrated Circuit Testing from a Quality Perspective","description":"\u003cp\u003e • Author(s): Eugene R. Hnatek\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Electronics - Circuits - General\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eApplies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Hardcover","offer_id":45282559885463,"sku":"9780442006433","price":7345.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780442006433.webp?v=1769302506","url":"https:\/\/atlanticbooks.com\/products\/digital-integrated-circuit-testing-from-a-quality-perspective-9780442006433","provider":"Atlantic Books","version":"1.0","type":"link"}