{"product_id":"electrical-and-thermal-characterization-of-mesfets-hemts-and-hbts-9780890067499","title":"Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs","description":"\u003cp\u003e • Author(s): Robert Anholt\u003cbr\u003e • Publisher: Artech House Publishers\u003cbr\u003e • Publisher Imprint: Artech House Publishers\u003cbr\u003e • BISAC: Electronics - Solid State\u003c\/p\u003e\u003cp\u003eThis work provides a comprehensive discussion of the bias dependence of equivalent circuit parameters for the three devices and an extensive discussion of temperature dependence. It: covers recess-etched MESFETs and self-aligned MESFETs with and without lightly-doped-drains and JFETs; analyzes GaAs-based pHEMTS and InP lattice-matched HEMT equivalent circuits; and describes a large-signal, temperature-dependent model extractor for A1GaAs-GaAs HBTs. The book is intended for circuit designers, process and device developers and test engineers.\u003c\/p\u003e","brand":"Artech House Publishers","offers":[{"title":"Hardcover","offer_id":47591696007319,"sku":"9780890067499","price":17137.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780890067499.webp?v=1774974157","url":"https:\/\/atlanticbooks.com\/products\/electrical-and-thermal-characterization-of-mesfets-hemts-and-hbts-9780890067499","provider":"Atlantic Books","version":"1.0","type":"link"}