{"product_id":"electromigration-9783639088137","title":"Electromigration","description":"\u003cp\u003e • Author(s): Linghong Li\u003cbr\u003e • Publisher: VDM Verlag Dr. Mueller E.K.\u003cbr\u003e • Publisher Imprint: VDM Verlag Dr. Mueller E.K.\u003cbr\u003e • BISAC: Physics - General\u003c\/p\u003e\u003cp\u003eElectromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnections. A common method for monitoring interconnection degradation is through electrical resistance measurements, which requires direct electrical contact. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose a novel Optical Microscopy Imaging Method (OMIM), and we provide a theoretical description and experimental results. OMIM not only pro-vides a new method for studying electromigration, but also provides a useful method for studying other micro-devices and materials in a non-contact mode.\u003c\/p\u003e","brand":"VDM Verlag Dr. Mueller E.K.","offers":[{"title":"Paperback","offer_id":46885424365719,"sku":"9783639088137","price":4509.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9783639088137.webp?v=1770247526","url":"https:\/\/atlanticbooks.com\/products\/electromigration-9783639088137","provider":"Atlantic Books","version":"1.0","type":"link"}