{"product_id":"electromigration-and-electronic-device-degradation-9780471584896","title":"Electromigration and Electronic Device Degradation","description":"\u003cp\u003e • Author(s): Aris Christou\u003cbr\u003e • Publisher: Wiley-Interscience\u003cbr\u003e • Publisher Imprint: Wiley-Interscience\u003cbr\u003e • BISAC: Electronics - Circuits - General\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eAddresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.\u003c\/p\u003e","brand":"Wiley-Interscience","offers":[{"title":"Hardcover","offer_id":45203842138263,"sku":"9780471584896","price":23840.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780471584896.webp?v=1767308272","url":"https:\/\/atlanticbooks.com\/products\/electromigration-and-electronic-device-degradation-9780471584896","provider":"Atlantic Books","version":"1.0","type":"link"}