{"product_id":"electron-energy-loss-spectroscopy-in-the-electron-microscope-9781441995827","title":"Electron Energy-Loss Spectroscopy in the Electron Microscope","description":"\u003cp\u003e • Author(s): R. F. Egerton\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Materials Science - General\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003cb\u003eFrom the Back Cover\u003c\/b\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp\u003eWithin the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, \u003ci\u003eElectron Energy-Loss Spectroscopy in the Electron Microscope\u003c\/i\u003e has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.\u003c\/p\u003e\u003cul\u003e\n\u003cli\u003eConsidered the \"Bible of EELS\"\u003c\/li\u003e\n\u003cli\u003ePresents the only in-depth, single-author text for the still-expanding field of TEM-EELS\u003c\/li\u003e\n\u003cli\u003eResponds to many requests for the first new edition of this classic work since 1996\u003c\/li\u003e\n\u003cli\u003eIncludes discussion of new spectrometer and detector designs, together with spectral-analysis techniques such as Bayesian deconvolution and multivariate statistical analysis\u003c\/li\u003e\n\u003cli\u003eProvides extended discussion of anisotropic materials, retardation effects, delocalization of inelastic scattering, and the simulation of energy-loss fine structure.\u003c\/li\u003e\n\u003cli\u003eDescribes recent applications of EELS to fields such as nanotechnology, electronic devices and carbon-based materials.\u003c\/li\u003e\n\u003cli\u003eOffers extended coverage of radiation damage and delocalization as limits to spatial resolution.\u003c\/li\u003e\n\u003c\/ul\u003e\u003cp\u003eFrom reviews of the first and second edition: \u003cbr\u003e\u003cbr\u003e\"The text....contains a wealth of practical detail and experimental insight....This book is an essential purchase for any microscopist who is using, or planning to use, electron spectroscopy or spectroscopic imaging.\" - \u003ci\u003e\u003cb\u003eJMSA\u003cbr\u003e\u003c\/b\u003e\u003c\/i\u003e\u003cbr\u003e\"Provides the advanced student with an indispensible text and the experienced researcher with a valuable reference.\" -- \u003ci\u003e\u003cb\u003eAmerican Scientist\u003c\/b\u003e\u003c\/i\u003e\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Hardcover","offer_id":45277394862231,"sku":"9781441995827","price":24238.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9781441995827.webp?v=1769288248","url":"https:\/\/atlanticbooks.com\/products\/electron-energy-loss-spectroscopy-in-the-electron-microscope-9781441995827","provider":"Atlantic Books","version":"1.0","type":"link"}