{"product_id":"electron-microprobe-analysis-and-scanning-electron-microscopy-in-geology-9780521142304","title":"Electron Microprobe Analysis and Scanning Electron Microscopy in Geology","description":"\u003cp\u003e • Author(s): S. J. B. Reed\u003cbr\u003e • Publisher: Cambridge University Press\u003cbr\u003e • Publisher Imprint: Cambridge University Press\u003cbr\u003e • BISAC: Earth Sciences - Geology\u003c\/p\u003e\u003cp\u003eOriginally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.\u003c\/p\u003e","brand":"Cambridge University Press","offers":[{"title":"Paperback","offer_id":46882657140887,"sku":"9780521142304","price":5860.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780521142304.webp?v=1770235878","url":"https:\/\/atlanticbooks.com\/products\/electron-microprobe-analysis-and-scanning-electron-microscopy-in-geology-9780521142304","provider":"Atlantic Books","version":"1.0","type":"link"}