{"product_id":"electrothermal-analysis-of-vlsi-systems-9780792378617","title":"Electrothermal Analysis of VLSI Systems","description":"\u003cp\u003e • Author(s): Yi-Kan Cheng | Ching-Han Tsai | Chin-Chi Teng\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Electronics - Circuits - VLSI\u003c\/p\u003e\u003cp\u003e\u003cem\u003eElectrothermal Analysis of VLSI Systems\u003c\/em\u003e addresses electrothermal problems in modern VLSI systems. \u003cbr\u003e Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal\/electrothermal simulation, and experimental setup-calibration). \u003cbr\u003e Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. \u003cbr\u003e \u003cem\u003eElectrothermal Analysis of VLSI Systems\u003c\/em\u003e will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Hardcover","offer_id":47614479204503,"sku":"9780792378617","price":11290.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780792378617.webp?v=1775094038","url":"https:\/\/atlanticbooks.com\/products\/electrothermal-analysis-of-vlsi-systems-9780792378617","provider":"Atlantic Books","version":"1.0","type":"link"}