{"product_id":"field-emission-scanning-electron-microscopy-new-perspectives-for-materials-characterization-9789811044328","title":"Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization","description":"\u003cp\u003e • Author(s): Nicolas Brodusch\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Materials Science - General\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eThis book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes\/scanning- transmission electron microscopes (SEM\/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM\/-TEM) historically run at higher beam accelerating voltage\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Paperback","offer_id":45280516538519,"sku":"9789811044328","price":5094.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9789811044328.webp?v=1769296542","url":"https:\/\/atlanticbooks.com\/products\/field-emission-scanning-electron-microscopy-new-perspectives-for-materials-characterization-9789811044328","provider":"Atlantic Books","version":"1.0","type":"link"}