{"product_id":"fringe-2009-6th-international-workshop-on-advanced-optical-metrology-9783642431692","title":"Fringe 2009: 6th International Workshop on Advanced Optical Metrology","description":"\u003cp\u003e • Author(s): Wolfgang Osten\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Industrial Engineering\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003cb\u003eFrom the Back Cover\u003c\/b\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp\u003eThe purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Optical Metrology in Imaging, Surface Monitoring, Stress Analysis, Non-Destructive Testing, Quality Control, and related fields.\u003c\/p\u003e \u003cp\u003eTopics of particular interest are: \u003c\/p\u003e \u003cul\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eNew Methods and Tools for the Generation, Acquisition, Processing, and Evaluation of Data in Optical Metrology (Digital Wavefront Engineering)\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eApplication Enhanced Technologies in Optical Metrology (Addressing enhanced Resolution, Reliability and Flexibility)\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003e4D Optical Metrology over a Large Scale Range (from Macro to Nano)\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eHybrid Measurement Techniques (Sensor Fusion and the Unification of Modeling, Simulation and Experiment)\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eNew Optical Sensors and Measurement Systems for Industrial Inspection.\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e\n\u003c\/ul\u003e \u003cp\u003eSpecial emphasis is put on modern measurement strategies, taking into account the active combination of physical modelling, computer aided simulation and experimental data acquisition. Special emphasis is directed towards new approaches for the extension of existing resolution limits that open the gates to wide scale metrology, ranging from nano to macro, by using advanced optical sensor systems.\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Paperback","offer_id":45275275493527,"sku":"9783642431692","price":22035.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9783642431692.webp?v=1769282421","url":"https:\/\/atlanticbooks.com\/products\/fringe-2009-6th-international-workshop-on-advanced-optical-metrology-9783642431692","provider":"Atlantic Books","version":"1.0","type":"link"}