{"product_id":"fundamentals-of-microstructural-characterization-of-materials-9780443341892","title":"Fundamentals of Microstructural Characterization of Materials","description":"\u003cp\u003e • Author(s): Hamid Garmestani | Navid Nasajpour Esfahani\u003cbr\u003e • Publisher: Elsevier\u003cbr\u003e • Publisher Imprint: Elsevier\u003cbr\u003e • BISAC: Materials Science - General\u003c\/p\u003e\u003cp\u003e\u003ci\u003eFundamentals of Microstructure Characterization of Materials \u003c\/i\u003eis an essential resource for understanding the various techniques and methods used in material characterization. This book delves into spectroscopic methods involving electromagnetic radiation, X-ray photoelectron analysis, atomic emission spectroscopy, and more. It provides thorough explanations of scanning electron microscopy and sample preparation techniques, including cutting, grinding, polishing, and etching. \u003c\/p\u003e\u003cp\u003e\u003c\/p\u003eOther important points covered in the book include microscopy fundamentals such as lens types, optical image formation principles, depth of field, and depth of focus. Statistical analysis methods, including cumulative distribution function, probability density function, and Gaussian distribution, are also discussed. Additionally, the application of X-ray diffraction in phase analysis of materials is explored in detail.","brand":"Elsevier","offers":[{"title":"Paperback","offer_id":47728861446295,"sku":"9780443341892","price":8694.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780443341892.webp?v=1777274783","url":"https:\/\/atlanticbooks.com\/products\/fundamentals-of-microstructural-characterization-of-materials-9780443341892","provider":"Atlantic Books","version":"1.0","type":"link"}