{"product_id":"introduction-to-focused-ion-beam-nanometrology-9780750327954","title":"Introduction To Focused Ion Beam Nanometrology","description":"\u003cp\u003e • Author(s): David C Cox\u003cbr\u003e • Publisher: IOP Publishing\u003cbr\u003e • Publisher Imprint: IOP Publishing\u003cbr\u003e • BISAC: Measurement\u003c\/p\u003e","brand":"IOP Publishing","offers":[{"title":"Paperback","offer_id":47890451824791,"sku":"9780750327954","price":6651.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780750327954.webp?v=1781180062","url":"https:\/\/atlanticbooks.com\/products\/introduction-to-focused-ion-beam-nanometrology-9780750327954","provider":"Atlantic Books","version":"1.0","type":"link"}