{"product_id":"ionizing-radiation-effects-in-mos-devices-and-circuits-9780471848936","title":"Ionizing Radiation Effects in Mos Devices and Circuits","description":"\u003cp\u003e • Author(s): T. P. Ma\u003cbr\u003e • Publisher: Wiley-Interscience\u003cbr\u003e • Publisher Imprint: Wiley-Interscience\u003cbr\u003e • BISAC: Electronics - Semiconductors\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eThe first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.\u003c\/p\u003e","brand":"Wiley-Interscience","offers":[{"title":"Hardcover","offer_id":45203877265559,"sku":"9780471848936","price":31954.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780471848936.webp?v=1767308277","url":"https:\/\/atlanticbooks.com\/products\/ionizing-radiation-effects-in-mos-devices-and-circuits-9780471848936","provider":"Atlantic Books","version":"1.0","type":"link"}