{"product_id":"machine-learning-support-for-fault-diagnosis-of-system-on-chip-9783031196386","title":"Machine Learning Support for Fault Diagnosis of System-On-Chip","description":"\u003cp\u003e • Author(s): Patrick Girard\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Electronics - Circuits - General\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003cb\u003eFrom the Back Cover\u003c\/b\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp\u003eThis book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques. \u003c\/p\u003e \u003cp\u003eThe benefits of the book for the reader are: \u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cul\u003e\n\u003cli\u003eIdentifies the key challenges in fault diagnosis of system-on-chip and presents the solutions and corresponding results that have emerged from leading-edge research;\u003c\/li\u003e\n\u003cli\u003eExplains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;\u003c\/li\u003e\n\u003cli\u003eIncludes necessary background information on testing and diagnosis and a compendium of solutions existing in this field;\u003c\/li\u003e\n\u003cli\u003eDemonstrates techniques based on industrial data and feedback from actual PFA analysis;\u003c\/li\u003e\n\u003cli\u003eDiscusses practical problems, including test sequence quality, diagnosis resolution, accuracy, time cost, etc.\u003c\/li\u003e\n\u003c\/ul\u003e \u003cp\u003e\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Hardcover","offer_id":45276482535575,"sku":"9783031196386","price":5876.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9783031196386.webp?v=1769285788","url":"https:\/\/atlanticbooks.com\/products\/machine-learning-support-for-fault-diagnosis-of-system-on-chip-9783031196386","provider":"Atlantic Books","version":"1.0","type":"link"}