{"product_id":"materials-reliability-in-microelectronics-ii-volume-265-9781107409682","title":"Materials Reliability in Microelectronics II: Volume 265","description":"\u003cp\u003e • Author(s): C. V. Thompson | J. R. Lloyd\u003cbr\u003e • Publisher: Cambridge University Press\u003cbr\u003e • Publisher Imprint: Cambridge University Press\u003cbr\u003e • BISAC: Electronics - General\u003c\/p\u003e\u003cp\u003eThe MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.\u003c\/p\u003e","brand":"Atlantic Books","offers":[{"title":"Paperback","offer_id":46499272261783,"sku":"9781107409682","price":3606.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9781107409682.webp?v=1769192921","url":"https:\/\/atlanticbooks.com\/products\/materials-reliability-in-microelectronics-ii-volume-265-9781107409682","provider":"Atlantic Books","version":"1.0","type":"link"}