{"product_id":"materials-reliability-in-microelectronics-iii-volume-309-9781107409484","title":"Materials Reliability in Microelectronics III: Volume 309","description":"\u003cp\u003e • Author(s): Kenneth P. Rodbell | William F. Filter | Harold J. Frost\u003cbr\u003e • Publisher: Cambridge University Press\u003cbr\u003e • Publisher Imprint: Cambridge University Press\u003cbr\u003e • BISAC: Materials Science - General\u003c\/p\u003e\u003cp\u003eThe MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.\u003c\/p\u003e","brand":"Atlantic Books","offers":[{"title":"Paperback","offer_id":46488918458519,"sku":"9781107409484","price":3515.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9781107409484.jpg?v=1766339874","url":"https:\/\/atlanticbooks.com\/products\/materials-reliability-in-microelectronics-iii-volume-309-9781107409484","provider":"Atlantic Books","version":"1.0","type":"link"}