{"product_id":"nanometer-technology-designs-high-quality-delay-tests-9780387764863","title":"Nanometer Technology Designs: High-Quality Delay Tests","description":"\u003cp\u003e • Author(s): Nisar Ahmed\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Nanotechnology \u0026amp; MEMS\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003cb\u003eFrom the Back Cover\u003c\/b\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp\u003eWhile adopting newer, better fabrication technologies provides higher integration and enhances performance, it also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz, timing-related defects have become a high proportion of the total chip defects. For nanometer technology designs, the traditional test methods cannot ensure a high quality level of chips, and at-speed tests using path and transition delay fault model have become a requirement in technologies below 180nm.\u003c\/p\u003e \u003cp\u003e\u003cstrong\u003e\u003cem\u003eNanometer Technology Designs: High-Quality Delay Tests\u003c\/em\u003e\u003c\/strong\u003e discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the delay test for nanotechnology designs. Topics covered include: \u003c\/p\u003e \u003cul\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eAt-speed test challenges for nanotechnology\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eLow-cost tester-friendly design-for-test techniques\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eImproving test quality of current at-speed test methods\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eFunctionally un-testable fault list generation and avoidance\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eTiming-based ATPG for screening small delay faults\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eFaster-than-at-speed test considering power supply noise\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003ePower supply noise tolerant at-speed test pattern generation and application\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eSolutions for dealing with crosstalk and signal integrity issues\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e\n\u003c\/ul\u003e \u003cp\u003e\u003cem\u003e\u003cstrong\u003eNanometer Technology Designs: High-Quality Delay Tests\u003c\/strong\u003e\u003c\/em\u003e is a reference for practicing engineers and researchers in both industry and academia who are interested in learning about and implementing the most-advanced methods in nanometer delay testing.\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Hardcover","offer_id":45277361963159,"sku":"9780387764863","price":7267.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780387764863.webp?v=1769288159","url":"https:\/\/atlanticbooks.com\/products\/nanometer-technology-designs-high-quality-delay-tests-9780387764863","provider":"Atlantic Books","version":"1.0","type":"link"}