{"product_id":"nanoscale-standards-by-metrological-afm-and-other-instruments-9780750331890","title":"Nanoscale Standards by Metrological AFM and Other Instruments","description":"\u003cp\u003e • Author(s): Ichiko Misumi\u003cbr\u003e • Publisher: IOP Publishing Ltd\u003cbr\u003e • Publisher Imprint: IOP Publishing Ltd\u003cbr\u003e • BISAC: Measurement\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eThis book reviews nanometrological standards before proceeding to detail pitch, step height, line width, nanoparticle size, and surface roughness. Essential for users making quantitative nanoscale measurements, in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications.\u003c\/p\u003e","brand":"Atlantic Books","offers":[{"title":"Hardcover","offer_id":46417958174871,"sku":"9780750331890","price":15203.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780750331890.webp?v=1769069276","url":"https:\/\/atlanticbooks.com\/products\/nanoscale-standards-by-metrological-afm-and-other-instruments-9780750331890","provider":"Atlantic Books","version":"1.0","type":"link"}