{"product_id":"noncontact-atomic-force-microscopy-volume-2-9783642260704","title":"Noncontact Atomic Force Microscopy: Volume 2","description":"\u003cp\u003e • Author(s): Seizo Morita\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Nanotechnology \u0026amp; MEMS\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003cb\u003eFrom the Back Cover\u003c\/b\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp\u003eSince the original publication of \u003cstrong\u003eNoncontact Atomic Force Microscopy\u003c\/strong\u003e in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms\/molecules and nanostructures with atomic\/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Paperback","offer_id":45274930217111,"sku":"9783642260704","price":16009.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9783642260704.webp?v=1769281367","url":"https:\/\/atlanticbooks.com\/products\/noncontact-atomic-force-microscopy-volume-2-9783642260704","provider":"Atlantic Books","version":"1.0","type":"link"}