{"product_id":"on-line-testing-for-vlsi-9781441950338","title":"On-Line Testing for VLSI","description":"\u003cp\u003e • Author(s): Michael Nicolaidis\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Electronics - Circuits - VLSI \u0026amp; ULSI\u003c\/p\u003e\u003cp\u003eTest functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as \u003cem\u003eon-line testing\u003c\/em\u003e. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. \u003cbr\u003e \u003cem\u003eOn-Line Testing for VLSI\u003c\/em\u003e contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent \u003cem\u003eIEEE International\u003c\/em\u003e \u003cem\u003eOn-Line Testing Workshops\u003c\/em\u003e. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. \u003cbr\u003e \u003cem\u003eOn-Line Testing for VLSI\u003c\/em\u003e is an edited volume of original research comprising invited contributions by leading researchers.\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Paperback","offer_id":45281665319063,"sku":"9781441950338","price":7277.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9781441950338.webp?v=1769299883","url":"https:\/\/atlanticbooks.com\/products\/on-line-testing-for-vlsi-9781441950338","provider":"Atlantic Books","version":"1.0","type":"link"}