{"product_id":"radiation-effects-soft-errors-v34-9789812389404","title":"Radiation Effects \u0026 Soft Errors ...(V34)","description":"\u003cp\u003e • Author(s): Ronald D. Schrimpf | Daniel M. Fleetwood\u003cbr\u003e • Publisher: World Scientific Publishing Company\u003cbr\u003e • Publisher Imprint: World Scientific Publishing Company\u003cbr\u003e • BISAC: Electrical\u003c\/p\u003e\u003cp\u003eThis book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.\u003c\/p\u003e","brand":"World Scientific Publishing Company","offers":[{"title":"Hardcover","offer_id":46896178167959,"sku":"9789812389404","price":16604.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9789812389404.webp?v=1770357141","url":"https:\/\/atlanticbooks.com\/products\/radiation-effects-soft-errors-v34-9789812389404","provider":"Atlantic Books","version":"1.0","type":"link"}