{"product_id":"rf-measurements-of-die-and-packages-9781580532730","title":"RF Measurements of Die and Packages","description":"\u003cp\u003e • Author(s): Scott A. Wartenberg\u003cbr\u003e • Publisher: Artech House Publishers\u003cbr\u003e • Publisher Imprint: Artech House Publishers\u003cbr\u003e • BISAC: Electronics - Circuits - General\u003c\/p\u003e\u003cp\u003eThis text is dedicated to the issues surrounding RFIC (radio-frequency integrated circuit) testing. It explains how to perform high-accuracy RF measurements of die and packages in the RF test lab. It defines the essential elements in an RF system, explains where errors can be found in such a system and shows how to mathematically remove them with calibration.\u003c\/p\u003e","brand":"Artech House Publishers","offers":[{"title":"Hardcover","offer_id":46895632187543,"sku":"9781580532730","price":12160.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9781580532730.webp?v=1770355062","url":"https:\/\/atlanticbooks.com\/products\/rf-measurements-of-die-and-packages-9781580532730","provider":"Atlantic Books","version":"1.0","type":"link"}