{"product_id":"scaling-effects-on-metal-oxide-semiconductor-device-characteristics-9780530002323","title":"Scaling Effects on Metal-oxide-semiconductor Device Characteristics","description":"\u003cp\u003e • Author(s): Steven Walstra\u003cbr\u003e • Publisher: Dissertation Discovery Company\u003cbr\u003e • Publisher Imprint: Dissertation Discovery Company\u003cbr\u003e • BISAC: Electrical\u003c\/p\u003e\u003cp\u003eDissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, \"Scaling Effects on Metal-oxide-semiconductor Device Characteristics\" by Steven V. Walstra, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.\u003c\/p\u003e","brand":"Dissertation Discovery Company","offers":[{"title":"Paperback","offer_id":47780235313303,"sku":"9780530002323","price":5911.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780530002323.webp?v=1778043549","url":"https:\/\/atlanticbooks.com\/products\/scaling-effects-on-metal-oxide-semiconductor-device-characteristics-9780530002323","provider":"Atlantic Books","version":"1.0","type":"link"}