{"product_id":"scanning-microscopy-for-nanotechnology-techniques-and-applications-9780387333250","title":"Scanning Microscopy for Nanotechnology: Techniques and Applications","description":"\u003cp\u003e • Author(s): Weilie Zhou | Zhong Lin Wang\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Nanotechnology \u0026amp; MEMS\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eThis book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Hardcover","offer_id":46891469832343,"sku":"9780387333250","price":25621.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780387333250.webp?v=1770274128","url":"https:\/\/atlanticbooks.com\/products\/scanning-microscopy-for-nanotechnology-techniques-and-applications-9780387333250","provider":"Atlantic Books","version":"1.0","type":"link"}