{"product_id":"scanning-transmission-electron-microscopy-advanced-characterization-methods-for-materials-science-applications-9780367655389","title":"Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications","description":"\u003cp\u003e • Author(s): Alina Bruma\u003cbr\u003e • Publisher: Taylor \u0026amp; Francis\u003cbr\u003e • Publisher Imprint: CRC Press\u003cbr\u003e • BISAC: Data Science - General\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003cem\u003e\u003cstrong\u003eScanning Transmission Electron Microscopy\u003c\/strong\u003e\u003c\/em\u003e is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures.\u003c\/p\u003e\u003cp\u003eThis book: \u003c\/p\u003e\u003cul\u003e \u003cp\u003e \u003c\/p\u003e \u003cli\u003eDiscusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data \u003c\/li\u003e \u003cp\u003e \u003c\/p\u003e \u003cli\u003ePresents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors\u003c\/li\u003e \u003cp\u003e \u003c\/p\u003e \u003cli\u003eDiscusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management \u003c\/li\u003e \u003cp\u003e \u003c\/p\u003e \u003cli\u003eFocuses on supervised and unsupervised machine learning for electron microscopy\u003c\/li\u003e \u003cp\u003e \u003c\/p\u003e \u003cli\u003eDiscusses open data formats, community-driven software, and data repositories\u003c\/li\u003e \u003cp\u003e \u003c\/p\u003e \u003cli\u003eProposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets\u003c\/li\u003e \u003cp\u003e \u003c\/p\u003e \u003cli\u003eProvides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation\u003c\/li\u003e \u003cp\u003e \u003c\/p\u003e \u003cli\u003eRecommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials\u003c\/li\u003e \u003c\/ul\u003e\u003cp\u003eThis book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science-derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.\u003c\/p\u003e","brand":"Taylor \u0026 Francis","offers":[{"title":"Paperback","offer_id":45243467169943,"sku":"9780367655389","price":4105.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780367655389.webp?v=1769234833","url":"https:\/\/atlanticbooks.com\/products\/scanning-transmission-electron-microscopy-advanced-characterization-methods-for-materials-science-applications-9780367655389","provider":"Atlantic Books","version":"1.0","type":"link"}