{"product_id":"semiconductor-memories-technology-testing-and-reliability-9780780310001","title":"Semiconductor Memories: Technology, Testing, and Reliability","description":"\u003cp\u003e • Author(s): Ashok K. Sharma\u003cbr\u003e • Publisher: Wiley-IEEE Press\u003cbr\u003e • Publisher Imprint: Wiley-IEEE Press\u003cbr\u003e • BISAC: Electronics - Semiconductors\u003c\/p\u003e\u003cp\u003eSemiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.\u003cbr\u003e * Memory cell structures and fabrication technologies.\u003cbr\u003e * Application-specific memories and architectures.\u003cbr\u003e * Memory design, fault modeling and test algorithms, limitations, and trade-offs.\u003cbr\u003e * Space environment, radiation hardening process and design techniques, and radiation testing.\u003cbr\u003e * Memory stacks and multichip modules for gigabyte storage.\u003c\/p\u003e","brand":"Wiley-IEEE Press","offers":[{"title":"Hardcover","offer_id":45203877953687,"sku":"9780780310001","price":20695.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780780310001.webp?v=1767308278","url":"https:\/\/atlanticbooks.com\/products\/semiconductor-memories-technology-testing-and-reliability-9780780310001","provider":"Atlantic Books","version":"1.0","type":"link"}