{"product_id":"silicon-carbide-power-devices-characteristics-test-and-application-9789819634798","title":"Silicon Carbide Power Devices: Characteristics, Test and Application","description":"\u003cp\u003e • Author(s): Yuan Gao | Yan Zhang\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Electronics - Semiconductors\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eFundamentals of Power Semiconductor Devices.- SiC Diode Main Characteristics.- Interpretation, Testing, and Application of SiC MOSFET Parameters.- Comparison of SiC and Si Device Characteristics.- Double-Pulse Test.- SiC Device Testing and Failure Analysis Techniques.- High d\u003cem\u003ei\u003c\/em\u003e\/d\u003cem\u003et\u003c\/em\u003e Effects and Countermeasures - Turn-off Voltage Overshoot.- Effects and Mitigation of High d\u003cem\u003ev\u003c\/em\u003e\/d\u003cem\u003et\u003c\/em\u003e - Crosstalk.- Impact and Countermeasures of High d\u003cem\u003ev\u003c\/em\u003e\/d\u003cem\u003et\u003c\/em\u003e - Common Mode Current.- Effects and Countermeasures of Common Source Inductance.- Drive Circuit.- Main Applications of SiC Devices.\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Hardcover","offer_id":47658113269911,"sku":"9789819634798","price":12810.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9789819634798.webp?v=1775817098","url":"https:\/\/atlanticbooks.com\/products\/silicon-carbide-power-devices-characteristics-test-and-application-9789819634798","provider":"Atlantic Books","version":"1.0","type":"link"}