{"product_id":"software-defect-and-operational-profile-modeling-9781461375593","title":"Software Defect and Operational Profile Modeling","description":"\u003cp\u003e • Author(s): Kai-Yuan Cai\u003cbr\u003e • Publisher: Springer\u003cbr\u003e • Publisher Imprint: Springer\u003cbr\u003e • BISAC: Software Development \u0026amp; Engineering - General\u003c\/p\u003e\u003cp\u003ealso in: \u003cem\u003eTHE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER\u003c\/em\u003e \u003cem\u003eAND INFORMATION SCIENCE\u003c\/em\u003e, Volume 1\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Paperback","offer_id":45282268676247,"sku":"9781461375593","price":14690.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9781461375593.webp?v=1769301650","url":"https:\/\/atlanticbooks.com\/products\/software-defect-and-operational-profile-modeling-9781461375593","provider":"Atlantic Books","version":"1.0","type":"link"}