{"product_id":"speckle-metrology-9780824789329","title":"Speckle Metrology","description":"\u003cp\u003e • Author(s): R.S. Sirohi\u003cbr\u003e • Publisher: Taylor \u0026amp; Francis\u003cbr\u003e • Publisher Imprint: CRC Press\u003cbr\u003e • Subject: Engineering\u003cbr\u003e • BISAC: Technology - Electricity \u0026amp; Electronics\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eThis practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.\u003c\/p\u003e","brand":"T\u0026F","offers":[{"title":"Hardcover","offer_id":45091909992599,"sku":"9780824789329","price":56382.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780824789329.webp?v=1769205270","url":"https:\/\/atlanticbooks.com\/products\/speckle-metrology-9780824789329","provider":"Atlantic Books","version":"1.0","type":"link"}