{"product_id":"surface-metrology-for-micro-and-nanofabrication-9780128178508","title":"Surface Metrology for Micro- and Nanofabrication","description":"\u003cp\u003e • Author(s): Wei Gao\u003cbr\u003e • Publisher: Elsevier\u003cbr\u003e • Publisher Imprint: Elsevier\u003cbr\u003e • BISAC: Materials Science - General\u003c\/p\u003e\u003cp\u003e\u003ci\u003eSurface Metrology for Micro- and Nanofabrication\u003c\/i\u003e presents state-of-the-art measurement technologies for surface metrology in fabrication of micro- and nanodevices or components. This includes the newest general-purpose scanning probe microscopes, and both contact and non-contact surface profilers. In addition, the book outlines characterization and calibration techniques, as well as in-situ, on-machine, and in-process measurements for micro- and nanofabrication.\u003c\/p\u003e","brand":"Elsevier","offers":[{"title":"Paperback","offer_id":45310356816023,"sku":"9780128178508","price":12382.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9780128178508.webp?v=1769287694","url":"https:\/\/atlanticbooks.com\/products\/surface-metrology-for-micro-and-nanofabrication-9780128178508","provider":"Atlantic Books","version":"1.0","type":"link"}