{"product_id":"the-effect-of-nuclear-reactions-on-integrated-circuit-reliability-9783639241280","title":"The Effect of Nuclear Reactions on Integrated Circuit Reliability","description":"\u003cp\u003e • Author(s): Nathaniel Dodds\u003cbr\u003e • Publisher: VDM Verlag\u003cbr\u003e • Publisher Imprint: VDM Verlag\u003cbr\u003e • BISAC: Engineering (General)\u003c\/p\u003e\u003cp\u003eDirect charge collection measurements are presented which prove that the presence of tungsten near sensitive volumes leads to extreme charge collection events through nuclear reactions. We demonstrate that, for a fixed incident particle linear energy transfer (LET), increasing particle energy beyond a certain point causes a decrease in nuclear reaction-induced charge collection. This suggests that a worst-case energy exists for single-event effect susceptibility, which depends on the technology, device layout, and the incident ions' fixed LET value. A Monte Carlo approach for identifying the worst-case energy is applied to certain bulk-Si and silicon-on-insulator technologies. Simulation results suggest that the decrease in charge collection beyond the worst-case energy occurs because the secondary particles produced from the high-energy nuclear reactions have less mass and higher energy and are therefore less ionizing than those produced by lower-energy reactions.\u003c\/p\u003e","brand":"VDM Verlag","offers":[{"title":"Paperback","offer_id":46886558892183,"sku":"9783639241280","price":4506.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9783639241280.webp?v=1770252229","url":"https:\/\/atlanticbooks.com\/products\/the-effect-of-nuclear-reactions-on-integrated-circuit-reliability-9783639241280","provider":"Atlantic Books","version":"1.0","type":"link"}