{"product_id":"x-ray-line-profile-analysis-in-materials-science-9781466658523","title":"X-Ray Line Profile Analysis in Materials Science","description":"\u003cp\u003e • Author(s): Jenő Gubicza\u003cbr\u003e • Publisher: Engineering Science Reference\u003cbr\u003e • Publisher Imprint: Engineering Science Reference\u003cbr\u003e • BISAC: Materials Science - General\u003c\/p\u003e\u003cp\u003eX-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.\u003c\/p\u003e","brand":"Atlantic Books","offers":[{"title":"Hardcover","offer_id":46489286770839,"sku":"9781466658523","price":21835.0,"currency_code":"INR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0666\/3471\/1191\/files\/9781466658523.jpg?v=1766341258","url":"https:\/\/atlanticbooks.com\/products\/x-ray-line-profile-analysis-in-materials-science-9781466658523","provider":"Atlantic Books","version":"1.0","type":"link"}