Search results for “[Subject: electron-microscopes-microscopy]”

• Author(s): R. F. Egerton • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - GeneralFrom the Back CoverThis popular textbook provides an introduction to the theory and practice of electron microscopy. The second edi...

• Author(s): R. F. Egerton • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyScanning and stationary-beam electron microscopes have become indispensable tools for both research and routine evaluatio...

• Author(s): R. F. Egerton • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - GeneralFrom the Back CoverWithin the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique us...

• Author(s): R. F. Egerton • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - GeneralFrom the Back CoverWithin the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique us...

• Author(s): R. F. Egerton • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - GeneralFrom the Back CoverThis popular textbook provides an introduction to the theory and practice of electron microscopy. The second edi...