Filters
- MIT Press
- ACM
- Atlantic Publishers & Distributors (P) Ltd
- Bentham Science Publishers
- Cambridge University Press
- Clanrye International
- Columbia University Press
- CRC Press
- Createspace Independent Publishing Platform
- Edicions Upc
- Edicoes Nosso Conhecimento
- Editions Notre Savoir
- Edizioni Sapienza
- Eliva Press
- Elsevier
- Glassdoor
- Grin Verlag
- Hassell Street Press
- IGI Global
- Independently Published
- Institution of Engineering & Technology
- Intechopen
- IOP Publishing Ltd
- John Wiley & Sons
- LAP Lambert Academic Publishing
- Larsen and Keller Education
- Literary Licensing, LLC
- Lulu.com
- Maker Media, Inc
- Materials Research Society
- McGraw-Hill Companies
- Momentum Press
- Morgan Kaufmann Publishers
- Newnes
- Notion Press Media Pvt Ltd
- Omniscriptum
- Oxford University Press
- Oxford UP
- Palala Press
- PHI Learning Pvt Ltd
- Scholars' Press
- Springer
- Springer Verlag
- T&F
- Taylor & Francis
- Taylor & Francis Inc
- Tredition Gmbh
- Univ Europeenne
- VDM Verlag
- VDM Verlag Dr. Mueller E.K.
- Verlag Unser Wissen
- Walter de Gruyter
- Wiley
- Wiley-IEEE Press
- Wiley-Interscience
- Wiley-Iste
- Wiley-Scrivener
- Wiley-Vch
- Willford Press
- World Scientific Publishing Company
- Wydawnictwo Nasza Wiedza
- Xlibris
- Xlibris Us
- MIT Press
- ACM
- Apress
- Atlantic
- Auerbach Publications
- Bentham Science Publishers
- Birkhauser
- Cambridge University Press
- Clanrye International
- Columbia University Press
- CRC Press
- Createspace Independent Publishing Platform
- Edicions Upc
- Edicoes Nosso Conhecimento
- Editions Notre Savoir
- Edizioni Sapienza
- Eliva Press
- Elsevier
- Glassdoor
- Grin Verlag
- Hassell Street Press
- IGI Global
- Independently Published
- Institution of Engineering & Technology
- Intechopen
- IOP Publishing Ltd
- John Wiley & Sons
- LAP Lambert Academic Publishing
- Larsen and Keller Education
- Literary Licensing, LLC
- Lulu.com
- Maker Media, Inc
- Materials Research Society
- McGraw-Hill Companies
- Momentum Press
- Morgan Kaufmann Publishers
- Newnes
- Notion Press Media Pvt Ltd
- Omniscriptum
- Oxford UP
- Palala Press
- PHI Learning Pvt Ltd
- River Publishers
- Scholars' Press
- Springer
- Tredition Gmbh
- Univ Europeenne
- VDM Verlag
- VDM Verlag Dr. Mueller E.K.
- Verlag Unser Wissen
- Vieweg+teubner Verlag
- Walter de Gruyter
- Wiley
- Wiley-IEEE Press
- Wiley-Interscience
- Wiley-Iste
- Wiley-Scrivener
- Wiley-Vch
- Willford Press
- World Scientific Publishing Company
- Wydawnictwo Nasza Wiedza
- Xlibris
- Xlibris Us
- David L. Dill
- A. B. Bhattacharyya
- A. P. Dorey
- Abdellatif Bellaouar
- Abhijit Ghosh
- Afreen Khursheed
- Ahmet Bindal
- Alexander Miczo
- Ali Mehrizi-Sani
- Alok Barua
- Ambika Prasad Shah
- Amit Dhawan
- Anand D. Darji
- Anantha Chandrakasan
- Anas N. Al-Rabadi
- Andreas Burg
- Andrew B. Kahng
- Andrew J. McKerrow
- Andrzej Handkiewicz
- Anish Deb
- Anu Gupta
- Aris Christou
- Arjuna Marzuki
- Arman Vassighi
- Arpita Patel
- Arturo Buscarino
- Ashok Goel
- Ashok K. Goel
- Balaji V. R.
- Balsha R. Stanisic
- Balwinder Raj
- Banmali S. Rawat
- Bathula Siva Kumar Reddy
- Behnam Ghavami
- Bharat Agarwal
- Biswajit Mishra
- Brajesh Kumar Kaushik
- C. Toumazou
- C. y. Chang
- Carlos Dualibe
- Charles J. Alpert
- Charles Platt
- Charlotte Stedman
- Cherry Bhargava
- Chi-Wah Kok
- Chih Tang Sah
- Cledo Brunetti
- Cosmin Radu Popa
- Cristina Azcona Murillo
- Cristina Silvano
- Daniel J. Mlynek
- De Dieuleveult
- Debaprasad Das
- DEBAPRASAD DAS
- Debika Chaudhuri
- Djeffal-F
- Duran Leblebici
- E. Ajith Amerasekera
- Elena-Ioana Vatajelu
- Elfadel
- Eugenio Culurciello
- F. Lombardi
- Farzin Asadi
- Feng Wang
- Franco Maloberti
- Froment-B
- Gabriel Alfonso Rincón-Mora
- Gary D. Hachtel
- Gejji Vineeta P.
- Gi-Joon Nam
- Gianluca Barile
- Giovanni Campardo
- Giovanni De Micheli
- Glsvlsi
- Glsvlsi '19
- Golla Eranna
- Gregory C. Smith
- Gustavo Neuberger
- H. S. Saini
- H. T. Kung
- Hafiz Md. Hasan Babu
- Harry Veendrick
- Hill
- Hirokazu Tohya
- Hoi-Jun Yoo
- Hongjiang Song
- Hubert Kaeslin
- Hussein Ballan
- Ispd'19
- Israel Koren
- Ivan S. Kourtev
- James B. Kuo
- Jean-Pierre DesChamps
- Jie Li
- Jingsheng Jason Cong
- Jo Nijs
- John D. Lenk
- John E. Ayers
- Jose G. Delgado-Frias
- Josef A. Nossek
Products
Trace Theory for Automatic Hierarchical Verification of Speed-Independent Circuits
David L. Dill
Paperback
Current price
₹3,535
Original price
₹4,242
Original price
₹4,242
Original price
₹4,242
(-17%)
₹3,535
Current price
₹3,535
| /
• Author(s): David L. Dill • Publisher: MIT Press • Publisher Imprint: MIT Press • BISAC: Computer ScienceSpeed-independent circuits offer a potential solution to the timing problems of VLSI. In this book David Dill develops and implements a theo...
View full details