Skip to content

Booksellers & Trade Customers: Sign up for online bulk buying at trade.atlanticbooks.com for wholesale discounts

Booksellers: Create Account on our B2B Portal for wholesale discounts

Characterization of Minerals, Metals, and Materials 2025: In-Situ Characterization Techniques

by Zhiwei Peng
Save 35% Save 35%
Current price ₹19,519.00
Original price ₹30,029.00
Original price ₹30,029.00
Original price ₹30,029.00
(-35%)
₹19,519.00
Current price ₹19,519.00

Imported Edition - Ships in 12-14 Days

Free Shipping in India on orders above Rs. 500

Request Bulk Quantity Quote
+91
Book cover type: Hardcover
  • ISBN13: 9783031806797
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 531
  • Original Price: EUR 279.99
  • Language: English
  • Edition: N/A
  • Item Weight: 1028 grams
  • BISAC Subject(s): Materials Science / Metals & Alloys and Earth Sciences / Mineralogy

The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include but are not limited to:

  • Extraction and processing of various types of minerals, process-structure-property relationship of metal alloys, glasses, ceramics, polymers, composites, semiconductors, and carbon using functional and structural materials
  • Novel methods and techniques for characterizing materials across a spectrum of systems and processes
  • Characterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of metals, polymers, and ceramics including battery materials
  • Characterization of structural, morphological, and topographical natures of materials at micro- and nano-scales
  • Characterization of extraction and processing including process development and analysis
  • Advances in instrument development for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM, FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques
  • 2D and 3D modelling for materials characterization

Zhiwei Peng, Central South University, Changsha, China;

Kelvin Yu Xie, Texas A&M University, College Station, TX, USA;

Mingming Zhang, Baowu Ouyeel Co. Ltd., Schererville, IN, USA;

Jian Li, CanmetMATERIALS, Hamilton, ON, Canada;

Bowen Li, Michigan Technological University, Houghton, MI, USA;

Sergio Neves Monteiro, Military Institute of Engineering, Rio de Janeiro, Brazil;

Rajiv Soman, AnalytiChem Group, West Chester, OH, USA;

Jiann-Yang Hwang, Michigan Technological University, Houghton, MI, USA;

Yunus Eren Kalay, Middle East Technical University, Ankara, Turkey;

Juan P. Escobedo-Diaz, University of New South Wales, Canberra, ACT, Australia;

John S. Carpenter, Los Alamos National Laboratory, Los Alamos, NM, USA;

Andrew D. Brown, DEVCOM ARL Army Research Office, Burlington, NC, USA;

Shadia Ikhmayies, University of Jordan, Amman, Jordan.

Trusted for over 48 years

Family Owned Company

Secure Payment

All Major Credit Cards/Debit Cards/UPI & More Accepted

New & Authentic Products

India's Largest Distributor

Need Support?

Whatsapp Us