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Microscopy of Semiconducting Materials 2007: Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK

A. G. Cullis

Hardcover

Current price ₹14,690
Original price ₹22,599
Original price ₹22,599
Original price ₹22,599
(-35%)
₹14,690
Current price ₹14,690

• Author(s): A. G. Cullis • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - GeneralFrom the Back CoverThe fifteenth international conference on Microscopy of Semiconducting Materials took place in Cambridge, UK on 2...

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Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

A. G. Cullis

Paperback

Current price ₹14,690
Original price ₹22,599
Original price ₹22,599
Original price ₹22,599
(-35%)
₹14,690
Current price ₹14,690

• Author(s): A. G. Cullis • Publisher: Springer • Publisher Imprint: Springer • BISAC: Physics - Condensed MatterFrom the Back CoverThis is a long-established international biennial conference series, organised in conjunction with the Royal Micro...

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Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987

A. G. Cullis

Hardcover

Current price ₹20,659
Original price ₹24,791
Original price ₹24,791
Original price ₹24,791
(-17%)
₹20,659
Current price ₹20,659

• Author(s): A. G. Cullis • Publisher: CRC Press • Publisher Imprint: CRC Press • BISAC: Physics - Condensed MatterThe various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research an...

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Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference Held 22-25 March 1999, University of Oxford, UK

A. G. Cullis, R. Beanland

Hardcover

Current price ₹39,470
Original price ₹65,783
Original price ₹65,783
Original price ₹65,783
(-40%)
₹39,470
Current price ₹39,470

• Author(s): A. G. Cullis | R. Beanland • Publisher: CRC Press • Publisher Imprint: CRC Press • BISAC: Physics - Condensed MatterWith IC technology continuing to advance, the analysis of very small structures remains critically important. Microsc...

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