Search results for “[Subject: microscopes-microscopy]”

• Author(s): Bharat Bhushan • Publisher: Springer • Publisher Imprint: Springer • BISAC: Microscopes & MicroscopyFrom the Back CoverThis book presents the physical and technical foundation of the state of the art in applied scanning probe tec...

• Author(s): Bharat Bhushan • Publisher: Springer • Publisher Imprint: Springer • BISAC: Nanotechnology & MEMSThe Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument...

• Author(s): Bharat Bhushan • Publisher: Springer • Publisher Imprint: Springer • BISAC: Nanotechnology & MEMSThe scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with...

• Author(s): Bharat Bhushan • Publisher: Springer • Publisher Imprint: Springer • BISAC: Nanotechnology & MEMSThe success of the Springer Series Applied Scanning Probe Methods I-VII and the rapidly expanding activities in scanning probe devel...

• Author(s): Bharat Bhushan • Publisher: Springer • Publisher Imprint: Springer • BISAC: Nanotechnology & MEMSThe scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with...

• Author(s): Bharat Bhushan • Publisher: Springer • Publisher Imprint: Springer • BISAC: Nanotechnology & MEMSThe Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trum...

• Author(s): Bharat Bhushan • Publisher: Springer • Publisher Imprint: Springer • BISAC: Microscopes & MicroscopyThe volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniqu...

• Author(s): Bharat Bhushan • Publisher: Springer • Publisher Imprint: Springer • BISAC: Nanotechnology & MEMSCrack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectrome...

• Author(s): Bharat Bhushan • Publisher: Springer • Publisher Imprint: Springer • BISAC: Nanotechnology & MEMSThe success of the Springer Series Applied Scanning Probe Methods I-VII and the rapidly expanding activities in scanning probe devel...

• Author(s): Bharat Bhushan • Publisher: Springer • Publisher Imprint: Springer • BISAC: Nanotechnology & MEMSThe scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with...