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Products
Electromigration Modeling at Circuit Layout Level
Cher Ming Tan
Paperback
Current price
₹3,672
Original price
₹5,649
Original price
₹5,649
Original price
₹5,649
(-35%)
₹3,672
Current price
₹3,672
| /
• Author(s): Cher Ming Tan • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electronics - Circuits - GeneralFrom the Back CoverIntegrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interco...
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Cher Ming Tan
Paperback
Current price
₹7,345
Original price
₹11,299
Original price
₹11,299
Original price
₹11,299
(-35%)
₹7,345
Current price
₹7,345
| /
• Author(s): Cher Ming Tan • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electronics - Circuits - IntegratedFrom the Back CoverApplications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detai...
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Electromigration in ULSI Interconnections
Cher Ming Tan
Hardcover
Current price
₹11,520
Original price
₹13,824
Original price
₹13,824
Original price
₹13,824
(-17%)
₹11,520
Current price
₹11,520
| /
• Author(s): Cher Ming Tan • Publisher: World Scientific Publishing Company • Publisher Imprint: World Scientific Publishing Company • BISAC: Electronics - SemiconductorsElectromigration in ULSI Interconnections provides a comprehensive descripti...
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