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Search results for “[Subject: information-technology]”

Sensing and Imaging for Defect Detection by Haitao Wang, Yongkai Zhu, Fei Fei

Sensing and Imaging for Defect Detection

Haitao Wang, Yongkai Zhu, Fei Fei

Hardcover

₹6,812
₹9,198
₹9,198
₹9,198
(-26%)
₹6,812
₹6,812

• Author(s): Haitao Wang | Yongkai Zhu | Fei Fei • Publisher: Mdpi AG • Publisher Imprint: Mdpi AG • BISAC: Engineering (General)With the progress made in science and technology, the quality of people's material and cultural lives has improved, m...

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