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Search results for “[subject: electron-microscopes-microscopy]”

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Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces

Sascha Sadewasser

Paperback

Current price ₹7,345
Original price ₹11,299
Original price ₹11,299
Original price ₹11,299
(-35%)
₹7,345
Current price ₹7,345

• Author(s): Sascha Sadewasser • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - Thin Films, Surfaces & InterfacesFrom the Back CoverIn the nearly 20 years of Kelvin probe force microscopy an increasing interest...

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Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces

Sascha Sadewasser

Hardcover

Current price ₹7,345
Original price ₹11,299
Original price ₹11,299
Original price ₹11,299
(-35%)
₹7,345
Current price ₹7,345

• Author(s): Sascha Sadewasser • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - Thin Films, Surfaces & InterfacesFrom the Back CoverIn the nearly 20 years of Kelvin probe force microscopy an increasing interest...

View full details

Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

Sascha Sadewasser

Paperback

Current price ₹14,690
Original price ₹22,599
Original price ₹22,599
Original price ₹22,599
(-35%)
₹14,690
Current price ₹14,690

• Author(s): Sascha Sadewasser • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - Thin Films, Surfaces & InterfacesFrom the Back CoverThis book provides a comprehensive introduction to the methods and variety of ...

View full details

Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

Sascha Sadewasser

Hardcover

Current price ₹14,690
Original price ₹22,599
Original price ₹22,599
Original price ₹22,599
(-35%)
₹14,690
Current price ₹14,690

• Author(s): Sascha Sadewasser • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - Thin Films, Surfaces & InterfacesFrom the Back CoverThis book provides a comprehensive introduction to the methods and variety of ...

View full details